Wafer-level testing Teradyne says that the deal will enable it to deliver scalable PIC test solutions at a time when PIC ...

High parallelism is a key factor in reducing costs during wafer-level testing. Wafer testing is conducted using Automatic Test Equipment (ATE) along with test infrastructures such as the Prober ...

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about their test equipment and how they support RF and microwave chip designs. Maury Microwave’s on-wafer probe station incorporates the Nano5G automated impedance tuner that’s optimized for ...

EV Group, an Austria-based supplier of equipment and process solutions for semiconductors, showed the next-generation version ...

Wafers are shipped out in a plastic ‘boat ... So let’s talk about the tools of the trade. Automated Test Equipment (ATE) is a bit of broad term, but we’re dealing here with dedicated ...

Teradyne, Inc. (Nasdaq: TER) today announced it has entered into a definitive agreement to acquire privately held Quantifi ...

FREMONT, CA - Aehr Test Systems, a global provider of semiconductor test and burn-in equipment, has announced the completion of its first FOX-XP™ wafer level burn-in system shipment to a customer in ...