Wafer inspection has become a critical part of the semiconductor manufacturing process. Inspections performed after wafer test can analyze the marks left by probe cards to ensure that the test process ...

NORTH READING, Mass.--(BUSINESS WIRE)-- Teradyne, a leading provider of automated test equipment, has partnered with ficonTEC, a global leader in production solutions for photonics assembly and test, ...

LIVERMORE, Calif., Oct. 16, 2019 (GLOBE NEWSWIRE) -- FormFactor, Inc. (NASDAQ: FORM), an industry-leading electrical test and measurement supplier to the semiconductor industry, will showcase new ...

Harmony eXP, a full-wafer-contact probe card from FormFactor, can test more than 1000 DRAM devices per touchdown and is capable (for some device designs) of supporting one-touchdown testing of a full ...

The use of on-wafer superconducting materials, other novel materials, and traditional semiconductors at cryogenic temperatures (below about 123K, or -150°C) has grown quickly in recent years.

New market study finds that the top six manufacturers of Wafer Test Probe Card occupied nearly 72.09% global market share. LEWES, DELAWARE, UNITED STATES, November 30 ...

Keeping an IC cool takes on new meaning when power dissipation exceeds 150 watts. Innovative electrical and mechanical solutions to new wafer testing challenges continue to be developed. For example, ...

In this interview, Jeremy Hope from Wentworth Laboratories talks to AZoM about why they are attending electronica. Please tell us about the company Wentworth Labs and why you are attending electronica ...

The report "Probe Pin Market by Pogo Type, Stamping Type, Spring Contact, Non-Spring Contact, Semiconductor Testing ...

I’ve had a fairly varied early part of my career in the semiconductors business: a series of events caused me to jump disciplines a little bit, and after one such event, I landed in the test ...