Now, a team of researchers led by Professor Huang Xian from the School of Precision Instrument and Opto-electronics ...

Tianjin University scientists have developed a pioneering nondestructive testing technology for micro-LED wafers, offering a ...

Cascade Microtech says that its S-Technology Pyramid Probe Cardsimprove contact consistency at wafer probe, enabling at-speed multisiteknown-good-die testing and reducing the overall cost-of-ownership ...

Conventional testing approaches face major limitations, with some methods damaging wafer surfaces irreversibly, while others ...

Teradyne, a leading provider of automated test equipment, has partnered with ficonTEC, a global leader in production solutions for photonics assembly and test, to announce the availability of the ...

Wafer testing is conducted using Automatic Test Equipment (ATE) along with test infrastructures such as the Prober Interface Board (PIB), signal tower, and probe card. In this paper, we present the ...

New market study finds that the top six manufacturers of Wafer Test Probe Card occupied nearly 72.09% global market share. LEWES, DELAWARE, UNITED STATES, November 30, 2022 /EINPresswire.com ...

NORTH READING, Mass., March 31, 2025--Teradyne, a leading provider of automated test equipment, has partnered with ficonTEC, a global leader in production solutions for photonics assembly and test ...

NORTH READING, Mass.--(BUSINESS WIRE)-- Teradyne, a leading provider of automated test equipment, has partnered with ficonTEC, a global leader in production solutions for photonics assembly and ...