Now, a team of researchers led by Professor Huang Xian from the School of Precision Instrument and Opto-electronics ...

According to Verigy, the V93000 Direct-Probe solution delivershigh-performance functional testing at wafer probe at a significantly lowercost of test. By removing the conventional mechanical interface ...

Gayn Erickson (President and CEO) reported a disposal of 4,518 shares of Aehr Test Systems (NASDAQ:AEHR) valued at $62,619 to either pay the exercise price of vested stock, or tax liability with ...

Conventional testing approaches face major limitations, with some methods damaging wafer surfaces irreversibly, while others ...

Global Wafer Test Probe Card Market Forecast New market study finds that the top six manufacturers of Wafer Test Probe Card occupied nearly 72.09% global market share. LEWES, DELAWARE, UNITED ...

The introduction of the double-sided wafer probe test cell is expected to have a significant impact on the silicon photonics and CPO market.

“We believe on-wafer testing systems should be as straightforward as possible,” said Jens Klattenhoff, VP and GM of the Systems Business Unit at FormFactor.

FormFactor's advanced wafer probe cards make contact with microscopic chip connections to verify functionality before chips are packaged -- catching defects early when they're cheapest to fix. Q1 ...

Conventional testing approaches face major limitations, with some methods damaging wafer surfaces irreversibly, while others lack precision due to high rates of missed detection and false alarms.