Electrical testing involves the simple connection of conductors, whether those are wafer probes or contacts on a final tester. For wafer testing, fixed probe cards are created for each die. The probe ...

Dice being singulated with a diamond saw The general plan is to use testing at a variety of points to improve overall quality, by weeding out bad wafers (PCM data) bad die (wafer probe ...

This project aims to provide a way to visualize wafer map data in windows applications A wafer map is something specific to semiconductor industry and usually the data is coming from Wafer Probe using ...

Combining the ENA Series Network Analyzer with Cascade Microtech's dual tip Air Coplanar® Probe (ACP), you can evaluate on-wafer multiport balanced components accurately. The ENA Series offers ...

Shanghai Institute of Microsystem and Information Technology, Chinese Academy of Sciences, Shanghai, China. Her current research interests include design and fabrication of integrated MEMS probe cards ...