Now, a team of researchers led by Professor Huang Xian from the School of Precision Instrument and Opto-electronics ...

Cascade Microtech says that its S-Technology Pyramid Probe Cardsimprove contact consistency at wafer probe, enabling at-speed multisiteknown-good-die testing and reducing the overall cost-of-ownership ...

By extending a 32-DUT tester to 64-DUT parallelism, a DRAM fab that produces 30,000 wafers per month can save as much as $15 million per year in wafer test costs (equipment depreciation, operators ...

“Today most DRAM bare die are sold without being tested at full array speed,” said Joo Young Lee, memory product manager at Teradyne. “Test speed at wafer probe has been limited to 60MHz or less by ...

Teradyne, a leading provider of automated test equipment, has partnered with ficonTEC, a global leader in production solutions for photonics assembly and test, to announce the availability of the ...

Conventional testing approaches face major limitations, with some methods damaging wafer surfaces irreversibly, while others ...

Our wafer probe stations have been selected for many leading-edge wafer test applications in the semiconductor industry across the globe. Semiconductors tested with our probers and cantilever probe ...

The team introduced a flexible three-dimensional probe array capable of adapting to the microscopic contours of micro-LED wafers, applying a pressure as low as 0.9 MPa, comparable to the softness ...

NORTH READING, Mass., March 31, 2025--Teradyne, a leading provider of automated test equipment, has partnered with ficonTEC, a global leader in production solutions for photonics assembly and test ...