Now, a team of researchers led by Professor Huang Xian from the School of Precision Instrument and Opto-electronics ...

Conventional testing approaches face major limitations, with some methods damaging wafer surfaces irreversibly, while others ...

Cascade Microtech says that its S-Technology Pyramid Probe Cardsimprove contact consistency at wafer probe, enabling at-speed multisiteknown-good-die testing and reducing the overall cost-of-ownership ...

The testing method checks micro-LED wafers without damage. It uses soft probes and tools to improve yield, lower costs, and ...

Tianjin University scientists have developed a pioneering nondestructive testing technology for micro-LED wafers, offering a ...

Teradyne, a leading provider of automated test equipment, has partnered with ficonTEC, a global leader in production solutions for photonics assembly and test, to announce the availability of the ...

NORTH READING, Mass., March 31, 2025--Teradyne, a leading provider of automated test equipment, has partnered with ficonTEC, a global leader in production solutions for photonics assembly and test ...