Chip reliability is coming under much tighter scrutiny as IC-driven systems take on increasingly critical and complex roles. So whether it’s a stray alpha particle that flips a memory bit, or some ...

In this pv magazine Webinar, we’ll examine the reliability profile and technical performance of n-type modules. We will explore a roadmap to TOPCon module production and hear from industry experts ...

The vulnerability of PERC modules to LID and LeTID is well known and among the reasons the industry is moving towards N-type technology, which tends to be less affected by the two phenomena. TUV Nord ...

The 2022 PV Module Reliability Scorecard, published today by PV Evolution Labs (PVEL), names 122 models of PV modules from 25 manufacturers as Top Performers in PVEL’s testing. PVEL is the leading ...

UV degradation was among the three most common test failures from Kiwa PVEL’s module testing this year. Image: Kiwa PVEL. As the year comes to a close, there is no doubt that this was the year of ...