Tech Xplore on MSN4mon
Solving long-standing challenge in semiconductor manufacturing—a refined algorithm for detecting wafer defects
Of course, no manufacturing technology is perfect and the intricate process of fabricating semiconductor chips inevitably ...
Semiconductor Engineering1y
A Framework For Improving Current Defect Inspection Techniques For Advanced Nodes
Using SAHI, inference is performed on size-increased slices of the SEM images. This leads to the object detector’s receptive field being more effective in capturing small defect instances. First, the ...
GIGAZINE18d
How are semiconductor chip grades determined, and how can we increase production of high-grade products?
Cerebras, a company that develops semiconductor ... wafer, but WSEs are manufactured as a single giant chip. At the time of writing, TSMC's manufacturing process for the 5nm node has a defect ...
AZOM13y
Semiconductor/Wafer Metrology Tools
and potential defect levels in order to optimize the manufacturing process of these devices. Metrology tools combined with wafer inspection capabilities are able to ensure that they target physical ...