Vacancy-type point defects, i.e., defects where one or several atoms are missing from a lattice site, are often present in rather high concentrations in semiconductors and insulators due to their ...

By varying crystal growth and processing conditions, the effects of crystalline defects and impurities at surfaces, interfaces and in the bulk semiconductor can be investigated and often enhanced or ...

Because the particles can be followed one-by-one, defects can be studied at the particle scale. (Image ... to control the carrier concentration and type (n-type or p-type) in semiconductors. For ...

AI is exceptionally good at spotting anomalies in semiconductor inspection. The challenge is training different models for ...

Capture Cross Section: A measure of the probability of a particle (electron or hole) being captured by a defect in a semiconductor material. Deep Traps: Energy levels within the bandgap of a ...

The semiconductor industry continues to grow in ... or the introduction of a dust particle that lands on the wafer during processing. These defects can cause a metal open or shorts. As feature sizes ...

Here, KLA Instruments ™ introduces the Nano Indenter ® G200X Semi Pack, a versatile tool for materials characterization for ...

This can limit their use in applications, such as LEDs, where high order and low density of defects are needed. Normally, these highly ordered semiconductors require high processing temperatures.

Carbon nanotubes present a game-changing solution for preventing defects in EUV lithography, supporting the semiconductor ... while maintaining excellent particle filtration, thicker and more ...

Dr. Mooney was chair of the Gordon Research Conference on Defects in Semiconductors, organized symposia at MRS meetings, and has served on the program committees of numerous other conferences. She was ...