By varying crystal growth and processing conditions, the effects of crystalline defects and impurities at surfaces, interfaces and in the bulk semiconductor can be investigated and often enhanced or ...

that can trigger revolutionary approaches to control the defect states," says semiconductor and nanophotonics specialist Prof. Chang-Hee Cho of the DGIST team. "We now hope to develop new ...

a new defect review system designed to enhance the analysis of nanoscale defects in advanced semiconductor chips. This system utilizes cutting-edge "cold field emission" (CFE) technology for high ...