Critical Dimension Scanning Electron Microscopy (CD-SEM) is a specialized technique used for high-resolution imaging and precise measurement of nanoscale structures in semiconductor manufacturing and ...
A technical paper titled “SEMI-PointRend: Improved Semiconductor Wafer Defect Classification and Segmentation as Rendering” was published (preprint) by researchers at imec, University of Ulsan, and KU ...
("UMC"), a leading global semiconductor foundry, today announced its A+ technology platform, a specialized 0.11um aluminum process manufactured in UMC’s 8” fabs. UMC is the only foundry to offer the ...
Hsinchu, Taiwan, September 22, 2015 – United Microelectronics Corporation (NYSE:UMC;TWSE: 2303) ("UMC"), a leading global semiconductor foundry ... true 12-volt aluminum back-end-of-line (BEoL) ...
Results that may be inaccessible to you are currently showing.
Hide inaccessible results
Feedback