Cornell scientists have developed a novel technique to transform symmetrical semiconductor particles into intricately twisted ...
Critical Dimension Scanning Electron Microscopy (CD-SEM) is a specialized technique used for high-resolution imaging and precise measurement of nanoscale structures in semiconductor manufacturing and ...
A new technical paper titled “Ultranarrow Semiconductor WS2 Nanoribbon Field-Effect Transistors” was published by researchers ...
NEMS refer to the integration of mechanical and electrical components at the nanoscale, typically involving structures that range from 1 to ... This is a false-color SEM image of a NEMS resonator. A ...
Forge Nano, Inc., an atomic layer deposition solution provider, today announced the completion of its new semiconductor cleanroom. The 2,000 sq ft cleanroom enables Forge Nano to manufacture multiple ...
A joint research team from South Korea and the United States has discovered a new material that can prevent performance degradation in semiconductor ... semimetallic nano ultrathin film" with ...