Electronic Design

Enhanced I/O Test Suite Facilitates Test Connections

Demand for simple and fast test-system connections in multivendor instrument setups pushed Agilent to come up with E2094N I/O Libraries Suite 14.0, which enables error-free connections in under 15 ...
EDN

Collaboration focuses on low-cost, high-speed serdes I/O test

SAN FRANCISCO — LogicVision Inc. and DA-Test have announced a collaboration on low-cost, high-accuracy testing of high speed serializer/ deserializer (serdes) circuits. Using LogicVision's ETSerdes ...
EDN

Unified methodology enables full-chip test

To succeed in the competitive electronics marketplace, semiconductor companies need silicon that is ready on schedule and with sufficient quality for the target application. Typical devices are ...
Design-Reuse

LogicVision and DA-Test Collaborate to Provide Low Cost High Speed SerDes I/O Test

SAN JOSE, Calif. — August 8, 2006 — LogicVision, Inc. (NASDAQ: LGVN), a leading provider of semiconductor test and yield learning solutions, today announced a successful collaboration with DA-Test ...
Design-Reuse

LogicVision and GDA Technologies Partner to Deliver LogicVision's Unique High Speed I/O Test IP

Design Automation Conference (DAC), San Francisco, Calif.— July 26, 2006 — LogicVision, Inc. (NASDAQ: LGVN), a leading provider of test and yield learning capabilities and GDA Technologies, Inc, a ...
InfoWorld

How I tested

The testing included standard installation and upgrade procedures, standard workload testing including Samba, Apache, and Sendmail, as well as file and network I/O testing. All tests were driven by ...