I will use a two-dimensional cross section of a silicon dioxide atomic structure and a corresponding energy band diagram to explain trap-assisted electron tunneling. Figure 1 illustrates electron ...

This study presents a non-destructive technique for PN junction depth measurement in silicon wafers, utilizing terahertz ...

In this study, the energy band diagram referenced to the vacuum level was clarified by applying ultraviolet photoelectron spectroscopy to the β-Ga 2 O 3 single crystal surface, and it was demonstrated ...