For wafer testing, fixed probe cards are created for each die ... In fact, fibers and waveguides are delicate devices, and touching them would risk damaging them. “Typical ports that you see on these ...

The brief was that the wafer probe yield was disastrous and the ... the tester interfaces to the application. A typical test floor with a device handler shown docked to a test head The idea ...

Report on how AI is driving market transformation - The global probe card market size is estimated to grow by USD 1.73 ...

For production, the first test is known as wafer sort or probe which differentiates the good devices from the defective ones. Once good devices are identifies the wafer is cut, and good devices are ...

The brief was that the wafer probe yield was disastrous and the correlation ... but if you like stories about silicon, or red-bearded test engineers, it’s worth it. Continue reading “Hair ...

Advanced packaging is transforming semiconductor manufacturing into a multi-dimensional challenge, blending 2D front-end wafer fabrication ... and mixed-signal devices, and challenges in parallel ...

Since no one has made a double-sided semiconductor device before, the team had to invent a new method to test and measure ... side of the wafer to it, which allowed them to probe both sides ...

Aehr Test Systems (NASDAQ:AEHR), a worldwide supplier of semiconductor test and burn-in equipment, today announced it has received an initial production order from a top tier automotive ...