Cluster tool scheduling occupies a pivotal role in semiconductor manufacturing, enabling the efficient coordination of complex multi-chamber systems that integrate processing and cleaning operations.

Detecting macro-defects early in the wafer processing flow is vital for yield and process improvement, and it is driving innovations in both inspection techniques and wafer test map analysis. At the ...

FREMONT, Calif., Sept. 23, 2021 (GLOBE NEWSWIRE) -- ACM Research, Inc. (ACM) (NASDAQ: ACMR), a leading supplier of wafer processing solutions for semiconductor and advanced wafer-level packaging (WLP) ...

A defect in a semiconductor chip may be smaller than a human hair but can create big problems in your everyday life, from crippling your car's steering to making your laptop more susceptible to ...

France-based company Unity-SC, which specializes in optical inspection tools for semiconductor wafer production, says that its new system will be able to increase yields in laser diode manufacturing.

We came across a bullish thesis on ACM Research, Inc. on FluentInQuality’s Substack. In this article, we will summarize the ...

As semiconductor manufacturers aim to produce devices at the 5-nanometer node, the ability to find tiny defects created inadvertently during the fabrication process becomes harder. In addition, there ...

BROOKLYN, N.Y.--(BUSINESS WIRE)--Nanotronics, a global leader in advanced microscopy and automation solutions, is announcing the launch of nSpec ES, a more affordable educational version of its ...

Across the full range of semiconductor device types and design nodes, there is a drive to produce chips with significantly higher quality. Automotive, IoT and other industrial applications require ...